Signal and Noise Properties of Gallium Arsenide Microwave Field-Effect Transistors

作者: Robert A. Pucel , Hermann A. Haus , Hermann Statz

DOI: 10.1016/S0065-2539(08)61205-6

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摘要: Publisher Summary This chapter examines the signal and noise properties of gallium arsenide (GaAs) microwave field-effect transistors (FET). High frequency (GaAs FETs) have demonstrated remarkably low figures high power gains at frequencies. A practical GaAs FET is usually fabricated by deposition or diffusion source, gate, drain contacts on surface an appropriately doped thin epitaxial n-type layer. layer, in turn, grown a semi-insulating wafer either vapor liquid technique. The apparent minor role played negative resistance region short-gate FETs suggests that radiofrequency instabilities due to this region, if they exist, occur frequencies far above normal regime FETs. small-signal equivalent circuit FET, valid up moderately elaborated. It found produced both sources intrinsic device thermal associated with parasitic resistances.

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