Unsupervised defect detection in textiles based on Fourier analysis and wavelet shrinkage.
作者： Guang-Hua Hu , Qing-Hui Wang , Guo-Hui Zhang
DOI: 10.1364/AO.54.002963
关键词:
摘要: … wavelet-based method for defect detection in textures, where … thresholding of background texture features so that defects can … and reconstruction is applied for noise removal and defects …
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harvard.edu参考文章(26)
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