作者: Xiaojun Sun , Laijun Liu , Saisai Liu , Yanmin Huang , Liang Fang
DOI: 10.1007/S11664-016-4595-1
关键词:
摘要: (1−x)K0.5Na0.5NbO3-xSrMnO3 (0.02 ≤ x 0.08) (KNN-xSM) ceramics were fabricated by a conventional solid-state technique. X-ray diffraction of the samples revealed that crystal structure changes from orthorhombic to tetragonal, and finally pseudocubic symmetry with increasing x. Temperature dependence dielectric properties showed temperature (T m) corresponding maximum permittivity decreased Two relaxation processes occurred at high temperatures, which attributed grain boundary responses, respectively. Polarization hysteresis loops (P-E) different electrical fields displayed. P rmax degenerated increase SM due thermally activated leakage current increases. The relationship between defect compensation mechanism is discussed.