Focused ion beam modification of atomic force microscopy tips for near-field scanning optical microscopy
作者： Jeffrey R. Krogmeier , Robert C. Dunn
DOI: 10.1063/1.1430028
关键词:
摘要: A probe for near-field scanning optical microscopy is demonstrated based on a high index glass sphere attached to the end of conventional atomic force tip. The machined into pyramid geometry using focused ion beam (FIB) instrument, coated with aluminum confine excitation light, and milled further FIB open an aperture at Near-field fluorescence images 50 nm fluorescent latex spheres reveal subdiffraction limit spatial resolution, illustrating utility these probes microscopy.
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