Microanalysis surface studies and photoemission properties of CsI photocathodes
作者： J. Almeida , A. Braem , A. Breskin , A. Buzulutskov , R. Chechik
DOI: 10.1016/0168-9002(95)00574-9
关键词:
摘要: We present recent results of the study surface properties and quantum efficiency (QE) CsI photocathodes prepared on various substrates. Microanalysis methods provide laterally resolved morphology chemical composition photoemissive film. Integral measurements QE were done with a monochromator system RICH device. It was shown that films deposited large area Ni- or Ni-Au-coated printed circuit electrodes have uniform crystalline structure an average close to reached polished stainless steel. The good stability in air over periods Ih. On microscopic scale 3-30 mu m, exhibit nonuniform emission correlated variations composition.
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