作者: Xufeng Wang , Dalton Chaffee , Peter Bermel
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摘要: In the push to build high-efficiency solar cells with less materials usage, thin-film have attracted an increasing amount of interest. Thin films are particularly attractive if they could exhibit light trapping and photon recycling capabilities exceeding those traditional wafer-based cells. Recent work by Alta Devices demonstrating a record single-junction efficiency 28.8% gallium arsenide thin film cell shows potential. However, most existing simulation tools do not handle these properties well -particularly recycling. this work, we develop improved tool accurately predict performance. It is based on fast layered wave-optical module coupled drift-diffusion electronic model. The S-matrix method was used solve for absorption at any point in given depths refractive indices each layer; results then calculate initial recycled generation profiles, self-consistently simulator, ADEPT 2.0, available nanoHUB.org -an openaccess science gateway cloud-based resources nanoscale technology. general, technique produced more accurate carrier distributions higher opencircuit voltage than predicted standard models, which has also been observed experiment. Preliminary presented that indicate approach capable modeling effects antireflection coatings (ARCs) various back reflectors. This new capability will be made through revised version 2.0.