Radio-frequency plasma modeling for low-temperature processing

作者: Toshiaki Makabe

DOI: 10.1016/S1049-250X(01)80031-8

关键词:

摘要: Abstract Plasma processing using a radio-frequency (rf) plasma for semiconductor device fabrication has been developed rapidly during the last decade. As basis of processing, an rf electron swarm transport under nonequilibrium conditions is described by Boltzmann equation. The system equations and various methods modeling are given.

参考文章(23)
C.K. Birdsall, A.B Langdon, Plasma Physics via Computer Simulation Plasma Physics via Computer Simulation. ,(1991) , 10.1201/9781315275048
H. Margenau, L. M. Hartman, Theory of High Frequency Gas Discharges. II. Harmonic Components of the Distribution Function 1 Physical Review. ,vol. 73, pp. 309- 315 ,(1948) , 10.1103/PHYSREV.73.309
Kenji Maeda, Toshiaki Makabe, Nobuhiko Nakano, Svetlan Bzenic-acute, Zoran Lj. Petrovic-acute, Diffusion tensor in electron transport in gases in a radio-frequency field Physical Review E. ,vol. 55, pp. 5901- 5908 ,(1997) , 10.1103/PHYSREVE.55.5901
R.E. Robson, R.D. White, T. Makabe, Charged Particle Transport in Harmonically Varying Electric Fields: Foundations and Phenomenology☆ Annals of Physics. ,vol. 261, pp. 74- 113 ,(1997) , 10.1006/APHY.1997.5733
Eiji Shidoji, Hiroto Ohtake, Nobuhiko Nakano, Toshiaki Makabe, Two-Dimensional Self-Consistent Simulation of a DC Magnetron Discharge Japanese Journal of Applied Physics. ,vol. 38, pp. 2131- 2136 ,(1999) , 10.1143/JJAP.38.2131
Toshiaki Makabe, Nobuhiko Nakano, Yukio Yamaguchi, Modeling and diagnostics of the structure of rf glow discharges in Ar at 13.56 MHz. Physical Review A. ,vol. 45, pp. 2520- 2531 ,(1992) , 10.1103/PHYSREVA.45.2520
Katsuji Okazaki, Toshiaki Makabe, Yukio Yamaguchi, Modeling of a rf glow discharge plasma Applied Physics Letters. ,vol. 54, pp. 1742- 1744 ,(1989) , 10.1063/1.101277
Peter LG Ventzek, Robert J Hoekstra, Mark J Kushner, Two-dimensional modeling of high plasma density inductively coupled sources for materials processing Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. ,vol. 12, pp. 461- 477 ,(1994) , 10.1116/1.587101