The combinatorial design approach to automatic test generation
作者： D.M. Cohen , S.R. Dalal , J. Parelius , G.C. Patton
DOI: 10.1109/52.536462
关键词:
摘要: The combinatorial design method substantially reduces testing costs. authors describe an application in which the reduced test plan development from one month to less than a week. In several experiments, demonstrated good code coverage and fault detection ability.
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