Why are chalcogenide glasses the materials of choice for Ovonic switching devices

作者: Hellmut Fritzsche

DOI: 10.1016/J.JPCS.2007.01.017

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摘要: Abstract Non-destructive switching from a high resistance OFF state to highly conducting ON occurs at critical field between 0.5 and 0.7 MV/cm in thin films of chalcogenide glasses placed two non-reacting contacts as discovered by S.R. Ovshinsky the 1960s. The device returns its original when current falls below holding value. We present theory this electronic state, which allows many billion reproducible cycles. In particular question is addressed why unique properties defect chemistry lead non-destructive effect. It proposed that initiated modified Zener tunneling breakdown. most voltage drop near electrodes confined filament. density supplied Fowler–Nordheim emission contacts. This made possible narrowness potential barriers turn consequence glasses. Electronic also observed Ovonic memory devices having preferred composition Ge 2 Sb Te 5 . large atomic sizes result partial 3-fold covalent coordination might affect related

参考文章(15)
John J. O'Dwyer, The theory of dielectric breakdown of solids UMI Books on Dmand. ,(1964)
David Adler, Heinz K. Henisch, Sir Nevill Mott, The mechanism of threshold switching in amorphous alloys Reviews of Modern Physics. ,vol. 50, pp. 209- 220 ,(1978) , 10.1103/REVMODPHYS.50.209
Marc Kastner, Bonding Bands, Lone-Pair Bands, and Impurity States in Chalcogenide Semiconductors Physical Review Letters. ,vol. 28, pp. 355- 357 ,(1972) , 10.1103/PHYSREVLETT.28.355
B K Ridley, Specific Negative Resistance in Solids Proceedings of the Physical Society. ,vol. 82, pp. 954- 966 ,(1963) , 10.1088/0370-1328/82/6/315
David Adler, Density of States in the Gap of Tetrahedrally Bonded Amorphous Semiconductors Physical Review Letters. ,vol. 41, pp. 1755- 1758 ,(1978) , 10.1103/PHYSREVLETT.41.1755
A theory of the electrical breakdown of solid dielectrics Proceedings of The Royal Society A: Mathematical, Physical and Engineering Sciences. ,vol. 145, pp. 523- 529 ,(1934) , 10.1098/RSPA.1934.0116
D.A. Baker, M.A. Paesler, G. Lucovsky, P.C. Taylor, EXAFS study of amorphous Ge2Sb2Te5 Journal of Non-crystalline Solids. ,vol. 352, pp. 1621- 1623 ,(2006) , 10.1016/J.JNONCRYSOL.2005.11.079
Marc Kastner, David Adler, H. Fritzsche, Valence-Alternation Model for Localized Gap States in Lone-Pair Semiconductors Physical Review Letters. ,vol. 37, pp. 1504- 1507 ,(1976) , 10.1103/PHYSREVLETT.37.1504
Matthew L. Wallace, Béla Joós, Shear-induced overaging in a polymer glass. Physical Review Letters. ,vol. 96, pp. 025501- 025501 ,(2006) , 10.1103/PHYSREVLETT.96.025501
D. Adler, M. S. Shur, M. Silver, S. R. Ovshinsky, Threshold Switching in Chalcogenide-Glass Thin Films Journal of Applied Physics. ,vol. 51, pp. 3289- 3309 ,(1980) , 10.1007/978-1-4684-8745-9_16