作者: C.K. Yao , L. Cao , L. Geng , Z.Y. Ma , S.Q. Guo
DOI: 10.1016/0254-0584(90)90098-U
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摘要: Abstract The morphology and substructure of SiC whisker in SiCw 6061Al composites were observed by a high voltage resolution electron microscope. generally has hexagonal or triangular cross section zigzag surface. Stacking faults parallel to the {111} planes found doublebeam condition. It was considered that stacking connected with matrix Frank partial dislocations whose Burgers vectors are a[111]/3. stripes straight lines [110] direction. There lot aluminium near whiskers. density dislocation zones formed around whiskers, as 10 /cm.