Pattern projection measurement grating

作者: Fumio Kobayashi

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摘要: In a pattern projection measurement grating, each cycle of the total amplitude sine wave is divided into eight sections, and thus sections white regions W black B according to ratio between area S So rectangular having same as in this section, so constitute binary pattern. Thus obtained pseudo density distribution close wave.

参考文章(2)
Nobuaki Kakimori, Shin Kishimoto, Yutaka Iwata, Kengo Nishigaki, Yoshihide Shigeyama, Yuichi Yamamoto, Inspecting device for inspecting printed state of cream solder ,(1993)