Effect of deep traps on the sensitization in LiF (TLD-100) phosphor
作者： Bhuwan Chandra , A. R. Lakshmanan , R. C. Bhatt
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摘要: The effect of residual thermoluminescence (RTL) on sensitization (S/S0) peak 5 (197°C) and 7 (257°C) in LiF (TLD-100) is studied. Intense UV irradiation (253.7 nm) at a temperature 300°C found to completely remove the RTL 8 (321°C) 10 (415°C) without altering very much 5. However, factor which has value about 41 for γ-dose 103 Gy post-annealing gets reduced 1.3 after intense bleaching 300°C. A TL model proposed basis dependence intensity (415°C).
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