作者: Sjoerd A. Veldhuis , Peter Brinks , Johan E. ten Elshof
DOI: 10.1016/J.TSF.2015.06.036
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摘要: A method based on X-ray reflectivity was used to study the densification behavior of 8 mol% yttria-stabilized zirconia for use in solid oxide fuel cells. Sol–gel derived thin electrolyte films were prepared via spin coating. Subsequent microwave-assisted rapid thermal annealing at 650–1000 °C resulted crack-free 70 nm films. maximum density approximately 95% achieved within 5 min 1000 °C. photoelectron spectroscopy depth analysis showed that shorter times, as opposed conventional heating, lower Si concentrations top surface and substrate interface