Bright field illumination system

摘要: A Bright Field Illumination system for inspecting a range of characteristically different kinds defects, depressions, and ridges in selected material surface. The has an illumination source placed near first focus elliptical reflector. In addition, camera facing the inspected area is focus. second reflector located at distance approximately twice reflector's above directs light from onto Due to shape reflector, that specularly reflected surface directed into which position ellipse. This creates brightly lighted background field against damage sites appear as high contrast dark objects can be easily detected by person or automated inspection system. method used combination with vision providing multiplexed data handling multiple characteristics including abrupt gradual variations differences between measured prior instruments.