Method for the simultaneous determination of anisotropic residual stresses and texture by x‐ray diffraction

摘要: A method is developed that yields the residual stress, orientation distribution coefficients, average crystallite dimension, microstrain, and crystal structure parameters from x‐ray diffraction data in a single‐step procedure. To this end, general approach introduced combines equations of micromechanics with harmonic description texture. All relationships are cast into Rietveld‐like format, which incorporates microstructure model derived line‐broadening methods. In manner, collected over whole x‐ray‐diffraction pattern at different tilting sample can be fitted directly. The associated fitting microstructure, texture micromechanical properties fields.