The chemistry of the compound semiconductor-intrinsic insulator interface

作者: N N Berchenko , Yu V Medvedev

DOI: 10.1070/RC1994V063N08ABEH000108

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摘要: … t We may note that a method for the modulation of the … intrinsic defects may be oxygen vacancies and the ruptured … low rate of oxidation it corresponds to 41 nm for an overall thickness of …

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