Review: Ultraviolet Fluorescence as Assessment Tool for Photovoltaic Modules
作者： Marc Kontges , Arnaud Morlier , Gabriele Eder , Eckhard Fleis , Bernhard Kubicek
DOI: 10.1109/JPHOTOV.2019.2961781
关键词:
摘要: Since 2010, the ultraviolet fluorescence (UVF) method is used to identify defects in wafer-based crystalline silicon photovoltaic (PV) modules. We summarize all known applications of imaging methods on PV modules and characteristics. The aim this review present basic principles for interpretation UVF images. allows detection cell cracks a chronological order occurrence, visualizing hot parts module, identifying deviating bill materials effects various material combinations are reproduced lab explained first time. Seasonal presented In addition, some not yet understood features images shown discussed. Furthermore, application manual, hood-based, drone-based inspection presented. analysis speed three has been measured under real conditions. For manual inspection, we found an evaluation 250 modules/h, hood-based system 200 modules/h up 720 modules/h.
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