Conductive nanostructure-based films with improved ESD performance
作者： Florian Pschenitzka
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摘要: Optical stacks containing one or more patterned transparent conductor layers may be damaged by electrostatic discharges that occur during the optical stack manufacturing process. Such damage result in non-conductive conductors within layer. An discharge protected include a substrate layer, first anti-static layer having sheet resistance of from about 10 6 ohms per square (Ω/sq) to 9 Ω/sq, and Methods testing assessing are provided.
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