Determination of Chemical State and External Magnetic Field Effect on the Energy Shifts and X-Ray Intensity Ratios of Yttrium and Its Compounds

摘要: The term 'X-ray fluorescence analysis' (XRF) refers to the measurement of characteristic fluorescent emission resulting from deexcitation inner shell vacancies produced in sample by means a suitable source radiation. For particular energy (wavelength) light emitted sample, number photons per unit time (generally referred as peak intensity or count rate) is related amount that analyte sample. counting rates for all detectable elements within are usually calculated counting, set time, detected various analytes' X-ray lines. It important note these lines actually observed peaks with semi-Gaussian distribution because imperfect resolution modern detector technology. Therefore, determining sample’s spectrum, and calculating rate elemental peaks, it possible qualitatively establish composition samples quantitatively measure concentration elements. XRF an analytical method determine chemical kinds materials. materials can be solid, liquid, powder, filtered other form. also sometimes used thickness layers coatings. fast, accurate non-destructive, requires only minimum preparation. Applications very broad include metal, cement, oil, polymer, plastic food industries, along mining, mineralogy geology, environmental analysis water waste useful technique research pharmacy. routine analysis, two major approaches distinguishable based on type spectra. Wavelength dispersive (WDXRF) analyses depend upon use diffracting crystal wavelength X-rays. Energy (EDXRF) employs detectors directly X-rays collecting ionization detecting medium.