Ion microprobe elemental analyses of impact features on interplanetary dust experiment sensor surfaces

作者: Dieter P. Griffis , Jim J. Wortman , Charles G. Simon , Jerry L. Hunter

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摘要: Hypervelocity impact features on several of the electro-active dust sensors utilized in Interplanetary Dust Experiment (IDE) were subjected to elemental analysis using an ion microprobe. The negatively biased sensor surfaces acted as traps for cations produced plasma plumes impacting particles. Impactor residue surrounds most two or three feature diameters. After etching away a layer carbonaceous/silicaceous surface contamination, low mass resolution survey scans are used tentatively identify presence impactor debris. High two-dimensional maps and dimensional depth profiling surrounding area show distribution relative composition location these six primary Long Duration Exposure Facility (LDEF) sides provides unique opportunity further define debris environment. Researchers applied same techniques contaminant set ultra-pure, highly polished single crystal germanium wafer witness plates that mounted row 12 exposed environment during entire mission.

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