作者: EihabM. Abdel-Rahman , A.H. Nayfeh
DOI: 10.1109/ICMENS.2004.1509008
关键词:
摘要: We propose a comprehensive approach to characterize the contact stiffness of surfaces using contact-mode Atomic Force Microscope (AFM). Our procedure utilizes subharmonic resonance order one-half probe-tip-sample system in conjunction with higher-order spectralmeasurements determine independently quadratic and cubic coefficients.