作者: F.M.A Margaça , I.M Miranda Salvado , J Teixeira
DOI: 10.1016/S0022-3093(96)00550-9
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摘要: Abstract Small angle neutron scattering (SANS) measurements have been performed to investigate the nanoscale structure of materials system xZrO2·SiO2 with x≤10 mol%, at different processing stages. The were prepared by sol–gel using alkoxides method, in strong acidic conditions. Samples studied as xerogels heat-treated 120° C and 850° C; wet gels gel point; after 4 h aging 60° C. samples showed extended linear chains ca. 10 nm long point. aged has a mass fractal dimension 1.8. 120°C xerogel shows homogeneous oxide regions 16 average diameter nature. For 850°C reduced about 13 presented sharp smooth surface, obeying Porod law.