作者: J. M. Garcı́a , J. P. Silveira , F. Briones
DOI: 10.1063/1.126992
关键词:
摘要: In segregation effects during InAs growth on GaAs(001) and critical thickness for self-assembled quantum dots are studied using a real time, in situ technique capable of measuring accumulated stress growth. Due to large (∼50%) surface floating In, dot formation takes place when less than one monolayer is pseudomorphically grown GaAs. A picture the process discussed basis equilibrium between dominated by energy.