作者: Stefanie Stuckenholz , Christin Büchner , Markus Heyde , Hans-Joachim Freund
DOI: 10.1021/JP512575N
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摘要: We present a local spectroscopy study of thin MgO films on Mo(001), investigated with combined noncontact atomic force microscope (nc-AFM) and scanning tunneling (STM). The work function Mo(001) MgO/Mo(001) was measured field emission resonance (FER) spectroscopy. the clean surface ΦMo determined to be 4.5 eV. After deposition an 8 layer thick film, it decreased ΦMgO/Mo = 3.2 eV (ΔΦFER −1.3 eV). This shift ΔΦFER, introduced by oxide film metal function, also contact potential difference (CPD) measurements. Here, lowering ΔΦCPD −1.1 measured. Furthermore, influence line defects, in compared pristine terrace sites film. we slightly higher +200 meV above defects as sites.