Atomic force microscopy study of the growth mechanism of ultrathin YBa2Cu3O7 (YBCO) films
作者： C.L Bai , C.F Zhu , X.W Wang , P.C Zhang , Q Li
DOI: 10.1016/S0040-6090(96)08873-6
关键词:
摘要: An atomic force microscope (AFM) was used to study the growth mechanism of ultrathin YBa2Cu3O7 (YBCO) films with thicknesses 2.5 nm, 7.5 12.5 nm and 25 nm. The YBCO were grown on SrTiO3 (100) crystal substrates without a 40 thick buffer layer PrBa2Cu3O7 (PBCO) respectively. AFM data indicated that grew spiral by modes, screw dislocations being typical modes. Three kinds dislocation found layer. Two them showed constant terrace heights, which 0.6 1.1 respectively, third kind combination three different heights 1.6 1.0 All had common feature: top columnar core height four times greater than length unit cell along c-axis. Moreover, terraces in all or multiples this value. This is approximately half c-axis lattice parameter YBCO, suggesting two-dimensional mode film plane.
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