High resolution electron microscopy of grain boundaries

摘要: Our ability to observe atomic-scale features of grain boundaries has tremendously improved during the past decade. In this paper we give, aided by a number examples, select overview, on progress in field boundary research directly related advent modern high-resolution electron microscopy (HREM) instruments (point-to-point resolution better than 0.2 nm). Examples issues addressed atomic structure observations oxides and metals will be given with emphasis systematic investigations role macroscopic microscopic parameters. Since comparisons between observed interface structures atomistic computer modeling results are quite important, considerable efforts towards quantification have been undertaken recently authors. Most valuable insights obtained examination range structures, using combination experimental results. manner HREM invaluable not only as test theoretical models, but also exposing common high-angle boundaries. This brought us closer goal generating general understanding its connection properties. Such studies regarding correlations geometry, interfacial energy, relaxation modes.