作者: Ercan Yılmaz , Rengin Peköz , Cüneyt Can
DOI: 10.1002/XRS.813
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摘要: Escape of Ge K x-rays, Compton-scattered incident radiation and photoelectrons from an HPGe detector was investigated for 81 keV photons. All three escape mechanisms were observed in the same experiment. Experimental fractions compared with results Monte Carlo simulations. Good agreement obtained However, simulations underestimated photoelectrons. Copyright © 2005 John Wiley & Sons, Ltd.