作者: Ian R. Post , Chia-Hong Jan , Giuseppe Curello , Mark Bohr
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摘要: A method of selectively forming a spacer on first class transistors and devices formed by such methods. The can include depositing conformal deposition layer substrate with different classes situated thereon, blocking to at least one transistors, dry etching the layer, removing second substrate, wet remaining layer. Devices may larger spacers compared class.