Wireless probe card verification system and method
作者： Susumu Kaneko
DOI:
关键词:
摘要: A probe card assembly can include a wireless link to an external verifier (e.g., debugger). The interface boundary scan of controller on the assembly. allow for verification while it is installed within prober.
google.it 参考文章(15)
Gayle Noble, Wireless hardware debugging ,(2006)
Igor Y. Khandros, Benjamin N. Eldridge, Remote Test Facility With Wireless Interface To Local Test Facilities ,(2005)
Roy J. Henson, Charles A. Miller, Matthew E. Chraft, Intelligent probe card architecture ,(2005)
Roy J Henson, Charles A Miller, Matthew E Chraft, Method of designing an application specific probe card test system ,(2007)
Igor Khandros, Charles Miller, A. Sporck, Benjamin Eldridge, Wireless test system ,(2007)
Charles A. Miller, Electromagnetically coupled interconnect system ,(2001)
Charles A. Miller, Contactless interfacing of test signals with a device under test ,(2005)
Igor Y. Khandros, Charles A. Miller, A. Nicholas Sporck, Benjamin N. Eldridge, Systems and methods for wireless semiconductor device testing ,(2004)
Keith J. Breinlinger, Eric D. Hobbs, Wafer test cassette system ,(2010)
Se-Jang Oh, Sang-Hoon Lee, Kwang-Yong Lee, Young-soo An, Wireless interface probe card for high speed one-shot wafer test and semiconductor testing apparatus having the same ,(2008)