Everything SAXS: small-angle scattering pattern collection and correction

摘要: For obtaining reliable nanostructural details of large amounts sample?and if it is applicable?small-angle scattering (SAS) a prime technique to use. It promises obtain bulk-scale, statistically sound information on the morphological nanostructure, and has thus led many researcher investing their time in over last eight decades development. Due pressure from scientists requesting more increasingly complex nanostructures, as well ever improving instrumentation leaving less margin for ambiguity, small-angle methodologies have been evolving at high pace past few decades.As quality any results can only be good data that go into these methodologies, improvements collection all imaginable correction steps are reviewed here. This work intended provide comprehensive overview corrections, aid scatterer decide which relevant measurement how corrections performed. Clear mathematical descriptions provided where feasible. Furthermore, no exist without decent estimate precision, error estimation propagation through alongside corrections. With collected pattern made highest standard, allowing authoritative characterization its analysis. A brief background scattering, developments years, pitfalls may encountered upon interpretation well.