Test and reliability in approximate computing
作者： Lorena Anghel , Mounir Benabdenbi , Alberto Bosio , Elena Ioana Vatajelu
DOI: 10.1109/IMS3TW.2017.7995210
关键词:
摘要: This paper presents an overview of approximate computing, from the perspective a test/reliability engineer. The focus this is not on actual conception hardware/software/algorithms, but how specific methods for test and reliability can be used to improve characteristics (power consumption, area, life expectancy, precision) computing.
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