作者: Katsuhisa Tanaka , Seisuke Nakashima , Koji Fujita , Kazuyuki Hirao
DOI: 10.1063/1.2199727
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摘要: We have prepared a zinc ferrite (ZnF2O4) thin film 85nm thick deposited on silica glass substrate by using radio frequency sputtering method. Faraday effect measurements been carried out not only for as-deposited but also annealed films. The at 300°C as well the exhibit large rotation angle wavelength of around 390nm. In particular, manifests largest among present films; 1.65°∕μm is attained 386nm. films 1.08μm magnetization room temperature, and dependence external magnetic field suggestive ferrimagnetic behavior.