Increasing the exchange-bias field of Ni0.5Co0.5O films by microstructural control
作者： Dinesh Martien , Kentaro Takano , A. E. Berkowitz , David J. Smith
DOI: 10.1063/1.123535
关键词:
摘要: The exchange-bias field produced by antiferromagnetic monoxide films has been shown to scale with the density of uncompensated interfacial spins. spin is inversely proportional grain diameter. Accordingly, we have prepared Ni0.5Co0.5O in which average diameter small, but grains are elongated, thus avoiding thermally activated fluctuations system associated small volumes. remained diameter, and was increased twice its previous maximum value without introducing significant thermal instability.
scitation.org
harvard.edu
elsevier.com
aip.org 
sci-hub.se 参考文章(6)
M. J. Carey, A. E. Berkowitz, Exchange anisotropy in coupled films of Ni81Fe19 with NiO and CoxNi1−xO Applied Physics Letters. ,vol. 60, pp. 3060- 3062 ,(1992) , 10.1063/1.106756
E. Fulcomer, S. H. Charap, Thermal fluctuation aftereffect model for some systems with ferromagnetic‐antiferromagnetic coupling Journal of Applied Physics. ,vol. 43, pp. 4190- 4199 ,(1972) , 10.1063/1.1660894
Kentaro Takano, R. H. Kodama, A. E. Berkowitz, W. Cao, G. Thomas, Interfacial Uncompensated Antiferromagnetic Spins: Role in Unidirectional Anisotropy in PolycrystallineNi81Fe19/CoOBilayers Physical Review Letters. ,vol. 79, pp. 1130- 1133 ,(1997) , 10.1103/PHYSREVLETT.79.1130
Kentaro Takano, R. H. Kodama, A. E. Berkowitz, W. Cao, G. Thomas, Role of interfacial uncompensated antiferromagnetic spins in unidirectional anisotropy in Ni81Fe19/CoO bilayers (invited) Journal of Applied Physics. ,vol. 83, pp. 6888- 6892 ,(1998) , 10.1063/1.367721
Ching Tsang, R.E. Fontana, Tsann Lin, D.E. Heim, V.S. Speriosu, B.A. Gurney, M.L. Williams, Design, fabrication and testing of spin-valve read heads for high density recording IEEE Transactions on Magnetics. ,vol. 30, pp. 3801- 3806 ,(1994) , 10.1109/20.333909
J.C.S. Kools, Exchange-biased spin-valves for magnetic storage IEEE Transactions on Magnetics. ,vol. 32, pp. 3165- 3184 ,(1996) , 10.1109/20.508381