Viscoelastic effects in nanometer‐scale contacts under shear

作者: K.J. Wahl , S.V. Stepnowski , W.N. Unertl

DOI: 10.1023/A:1019169019617

关键词:

摘要: We demonstrate the effects of shear modulation on viscoelastic response nanometer‐scale single‐asperity contacts under static and dynamic loading conditions. Contact stiffness relaxation time are determined for to poly(vinylethylene) using a scanning force microscope (SFM). Knowledge torsional κΘ SFM cantilever is not required determine time. The was several orders magnitude slower than bulk but decreased slowly value as sample age increased. Contacts showed no evidence microslip. show that observed during making breaking provides information about evolution contact area available in vs. distance curve measurements.

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