作者: Deepanjan Bhattacharya , Louis T. Germinario , William T. Winter
DOI: 10.1016/J.CARBPOL.2007.12.005
关键词:
摘要: … atomic force microscope (AFM), Dimension series D3000 … imaging polymer surfaces since the AFM tip intermittently contacts the surface leading to a minimization of destructive lateral …