Chapter 14 – SECONDARY ELECTRON FINE STRUCTURE—A METHOD OF LOCAL ATOMIC STRUCTURE CHARACTERIZATION
作者： Yu.V. Ruts , D.E. Guy , D.V. Surnin , V.I. Grebennikov
DOI: 10.1016/B978-012513910-6/50033-5
关键词:
摘要: The use of an electron probe for analyzing the surface a substance is one conventional experimental methods used in physics condensed matter and, particular, thin films. This because strong interaction electrons with substance, which ensures sensitivity investigation from several angstroms to tens angstroms. Development method extracting information on local atomic structure secondary fine structures (SEFS) experiments should be focused obtaining more exact estimates integral equation kernel parameters. obtained by these importance studying disordered films and surfaces, traditional diffraction turn out unsuitable. Finally, along spectroscopic surfaces matter, SEFS spectroscopy allow additional often unique properties solids obtained.
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