作者: Koji Aizawa , Eisuke Tokumitsu , Kojiro Okamoto , Hiroshi Ishiwara
DOI: 10.1063/1.126424
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摘要: An annealing method for preparing SrBi2Ta2O9 (SBT) thin films, a face-to-face method, is proposed, and its effectiveness demonstrated. In this an SBT film deposited on substrate using sol-gel technique was directly put with the side down other during crystallization process. The films were crystallized at 750 °C in oxygen flow successively annealed 400 °C 6.2 wt % ozone flow. It found that remanent polarization value (2Pr) 175-nm-thick as large 23 μC/cm2 when conducted. also from time-dependent leakage current measurement density of lower than 1×10−9 A/cm2 electric field 65 kV/cm.