An Apparatus to Determine the Pull-Off Force of a Conducting Microparticle from a Charged Surface
作者： T. R. Szarek , P. F. Dunn
DOI: 10.1080/02786820601064865
关键词:
摘要: A unique experimental apparatus has been developed to determine the pull-off force of a conducting microparticle resting on surface in presence DC electric field. The precisely measures applied electric-field strength at which an individual known diameter, is measured situ, removed from surface. This information used adhesion required remove within uncertainty approximately 12% 95% confidence. In experiment, field between conducting-surface electrode and grounded increased time using microcontroller-driven digital-to-analog converter. Both electrodes are semi-transparent, permits surface-resident microparticles be viewed underneath microphotography. microphotography system operated conjunction with pixel-intensity, gradient-search software diame...
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