作者: Jeffrey A. Koch , Otto L. Landen , Troy W. Barbee , Peter Celliers , Luiz B. Da Silva
DOI: 10.1364/AO.37.001784
关键词:
摘要: Multi-kilo-electron-volt x-ray microscopy will be an important laser-produced plasma diagnostic at future megajoule facilities such as the National Ignition Facility (NIF). However, laser energies and characteristics imply that more challenging NIF than existing facilities. We use analytical estimates numerical ray tracing to investigate several instrumentation options in detail, we conclude near-normal-incidence single spherical or toroidal crystals may offer best general solution for high-energy similar large Apertured Kirkpatrick-Baez microscopes using multilayer mirrors also good options, particularly applications requiring one-dimensional imaging over narrow fields of view.