Depth Profiling of Polymer Blends and Optical Fiber with the Aid of SIMS

摘要: In inhomogeneous polymer blends we cannot expect a homogeneous distribution of each component along the direction vertical to free surface. Even in might be affected by surface energy. This leads importance establishment depth profiling method. For blends, AKIYAMA(1) has classified characterization methods into three categories: morphological, chemicophysical, and thermodynamic. They have been appreciated as useful methods. Besides these methods, present authors would like propose an application secondary ion mass spectrometry (SIMS) method for characterizing especially profiling.