Ordering effects in thin smectic-C* films: An x-ray-reflectivity study.
作者： E. Olbrich , O. Marinov , D. Davidov
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摘要: The x-ray-reflectivity technique is used to study the smectic order and smectic-A (Sm-A) smectic-C * (Sm-C ) phase transition in thin ultrathin films (150-600 A) of chiral ferroelectric liquid-crystal mixture ZLI-3654 (produced by Merck). films, which are spin cast on various substrates [very smooth (float) glass, Si wafer, polymer-coated etc.], spontaneously with layering parallel substrate surface; film alignment induced anchoring forces at film-air interface. reflectivity profiles could be well described a sinusoidal density modulation perpendicular
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