作者: H. Faiz , K. Siraj , M. S. Rafique , S. Naseem , A. W. Anwar
DOI: 10.1007/S12648-014-0597-0
关键词:
摘要: Thin films of pure and zinc doped copper oxide have been grown on Si (1 0 0) substrate using pulsed laser deposition at varying concentrations zinc. The effects the doping concentration structural, surface optical properties all thin investigated. X-ray diffraction shows presence monoclinic CuO phase compressive stresses in films. Raman spectra show an up-shift peak position for Micrographs smooth morphology, free from micron sized generated particulates. Spectroscopic el- lipsometry has used to study constants (w, D ,n , k,e1, e2). Optical bandgap energies calculated found be dependent Consequently, Zn induced strong microstructure