Temperature dependence of the interfacial dielectric loss process in glass bead‐filled polyethylene

作者: P. A. M. Steeman , J. F. H. Baetsen , F. H. J. Maurer

DOI: 10.1002/PEN.760320508

关键词:

摘要: The temperature dependence of the interfacial dielectric loss process in glass bead-filled high density polyethylene (HDPE) due to an interfacially adsorbed water layer has been studied. frequency maximum shifts lower frequencies with decreasing temperature. This is thought be mobility free charge carriers layer, resulting reduced conductivity layer. shifting peaks can described well-known Arrhenius relation. energy activation, as obtained from this relation, shows a stron on thickness For thinner layers higher activation found, indicating that are increasingly affected by presence bound charges surface. offers some possible applications. First, information extracted and second, it becomes study effect modifications such application coupling agents.

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