Electrical Characterization of Silicon-on-Insulator Materials and Devices
作者： Sorin Cristoloveanu , Sheng S. Li
DOI:
关键词:
摘要: 1. Introduction. 2. Methods of Forming SOI Wafers. 3. Devices. 4. Wafer Screening Techniques. 5. Transport Measurements. 6. SUS Capacitor Based Characterization 7. Diode 8. Transistor Characteristics. 9. 10. Monitoring the Degradation. Index.
springer.com
amazon.com参考文章(0)