Multiscale modeling of polycrystalline silicon
作者： Youping Chen , James D. Lee
DOI: 10.1016/J.IJENGSCI.2003.11.004
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摘要: Polycrystalline solid is composed of randomly distributed grains and grain boundaries. The size usually in the nano/micro-scale. In this paper, general micromorphic theory, as well a specialized theory for covalent ionic crystals, introduced. A statistical model polycrystalline material adopted. Each modeled crystallized by while boundaries are its amorphous phase classical continuum theory. Size-dependent properties silicon investigated. Finite element analysis thermomechanical coupling phenomenon performed numerical results presented discussed.
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