作者: Julian Rosalie , Laure Bourgeois
DOI: 10.1007/978-3-319-65136-1_64
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摘要: The interfacial structure and composition of θ′ (Al2Cu) precipitates in Al-0.9at.%Cu-0.9at.%Ag alloys were examined using high resolution electron microscopy. High angle annular dark field scanning transmission microscope (HAADF-STEM) images showed the presence a silver(Ag)-rich bi-layer on coherent (100) θ′-Al interfaces (1). Despite this layer, growth ledges observed phase thickening was able to proceed via step height 0.5c(θ′).