Structure analysis of the σ equals; 7 ((1230)/[0001] 21.8°) grain boundary in α-Ti
作者： Yuchen Wang , Jihong Li , Hengqiang Ye
DOI: 10.1080/01418619608242978
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摘要: Abstract High-resolution transmission electron microscopy is used to observe a σ equals; 7 ((1230)/[0001] 21.8°) grain boundary in α-Ti. Relaxed structural models and image simulation are investigate the structure. The modelling structure which shows best fit for experimental one where dislocation cores separated by nearly perfect regions at boundary.
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