Investigation of melt-textured superconductors on the nanoscale

摘要: Abstract For the further development of bulk, melt-processed high- T c superconductors it is an essential issue to control material properties on nanoscale, as length scale where flux pinning takes place order 10 nm. As a consequence, we need investigate samples accordingly nanoscale. Therefore, have performed atomic force microscopy (AFM) and scanning tunnelling (STM) scans sample surfaces at ambient conditions which resolved rich variety microstructures in bulk samples. With recent developments, also (electron backscatter diffraction) EBSD technique reaches nanometre range enabling study crystallographic details, especially effect embedded nanoparticles superconducting matrix. In obtain direct proof effect, output low-temperature STM revealing electronic nature studied well. Further developments technique, e.g., employing ferromagnetic tips, may bring informations properties.