Automatic Metallic Surface Defect Detection and Recognition with Convolutional Neural Networks

作者: Xian Tao , Dapeng Zhang , Wenzhi Ma , Xilong Liu , De Xu

DOI: 10.3390/APP8091575

关键词:

摘要: … in surface defect detection applications. Due to the cascaded architecture, more accurate and consistent defect detection … lighting condition and ambiguous defects. Moreover, only one …

参考文章(31)
Xiao-cui Yuan, Lu-shen Wu, Qingjin Peng, An improved Otsu method using the weighted object variance for defect detection Applied Surface Science. ,vol. 349, pp. 472- 484 ,(2015) , 10.1016/J.APSUSC.2015.05.033
Apostolos Chondronasios, Ivan Popov, Ivan Jordanov, Feature selection for surface defect classification of extruded aluminum profiles The International Journal of Advanced Manufacturing Technology. ,vol. 83, pp. 33- 41 ,(2016) , 10.1007/S00170-015-7514-3
Yi-Gang Cen, Rui-Zhen Zhao, Li-Hui Cen, Li-Hong Cui, Zhen-Jiang Miao, Zhe Wei, Defect inspection for TFT-LCD images based on the low-rank matrix reconstruction Neurocomputing. ,vol. 149, pp. 1206- 1215 ,(2015) , 10.1016/J.NEUCOM.2014.09.007
Moe Win, A. R. Bushroa, M. A. Hassan, N. M. Hilman, Ari Ide-Ektessabi, A Contrast Adjustment Thresholding Method for Surface Defect Detection Based on Mesoscopy IEEE Transactions on Industrial Informatics. ,vol. 11, pp. 642- 649 ,(2015) , 10.1109/TII.2015.2417676
Xiaolong Bai, Yuming Fang, Weisi Lin, Lipo Wang, Bing-Feng Ju, Saliency-Based Defect Detection in Industrial Images by Using Phase Spectrum IEEE Transactions on Industrial Informatics. ,vol. 10, pp. 2135- 2145 ,(2014) , 10.1109/TII.2014.2359416
Scott Schaefer, Travis McPhail, Joe Warren, Image deformation using moving least squares international conference on computer graphics and interactive techniques. ,vol. 25, pp. 533- 540 ,(2006) , 10.1145/1141911.1141920
Sidnei Alves de Araújo, Jorge Henrique Pessota, Hae Yong Kim, Beans quality inspection using correlation-based granulometry Engineering Applications of Artificial Intelligence. ,vol. 40, pp. 84- 94 ,(2015) , 10.1016/J.ENGAPPAI.2015.01.004
K.L. Mak, P. Peng, K.F.C. Yiu, Fabric defect detection using morphological filters Image and Vision Computing. ,vol. 27, pp. 1585- 1592 ,(2009) , 10.1016/J.IMAVIS.2009.03.007