作者: Shihui Ge , M. B. Stearns
DOI: 10.1063/1.340207
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摘要: The electrical resistivity of a series Co‐Cr multilayered thin films (MLS) equal layer thickness ∼30–30 A made at various substate temperatures and deposition rates 0.5 2 A/s was measured over the temperature range 4.2–350 K. most striking feature seen in several these MLS that bump near Neel TN spin‐density wave (SDW) Cr 2–4 times greater than CrCo alloys. is also much sharper an increase alloys has been attributed to enhancement SDW due exchange interaction between Co moments SDW. It proposed even larger superlattice structure MLS. This changes Fermi surface by introducing new Brillouin zones thus increases nesting which gives rise variation values varies systematically with substrate temperature....